RESEARCH AND DEVELOPMENT PROGRAM. INTRINSIC RELIABILITY SUBMINIATURE CERAMIC CAPACITORS.
Abstract
Efforts were continued on investigations leading to approaches to the attainment of high reliability in subminiature ceramic capacitors and the determination of failure rate as as a function of voltage and temperature. Testing of C67 Case Size I capacitors of the improved version continues to demonstrate the long-life capability of this capacitor at used conditions. The testing of 124 of these capacitors at 200 VDC and 125 C for 2500 hr without catastrophic failure, then at 400 VDC and 125 C for 6400 hr with only five displaying degradation, continues to indicate the intrinsic high reliability of this unit. The relationship between resistance and time for the improved version of the capacitor has been found to be variable from lot-to-lot, probably depending on differences in batches of raw materials. Studies to reduce this variability are being undertaken. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 31, 1965
- Accession Number
- AD0468839
Entities
People
- P. M. Kennedy
- T. I. Prokopowicz
Organizations
- Sprague Electric