FAILURE MECHANISMS IN RESISTORS.

Abstract

Results of research on failure mechanisms in thin metal film resistors are described. Mathematical modeling efforts based on the analysis of available matrix test data are discussed, and experimental means for determining concentration gradients and oxidation rate constants for thin nichrome films are presented. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1965
Accession Number
AD0474076

Entities

People

  • A. Horberg
  • F. R. Hand
  • M. E. Goldberg
  • N. Parikh
  • W. D. Brennan

Organizations

  • IIT Research Institute

Tags

DTIC Thesaurus Topics

  • Chemical Reaction Properties
  • Chemical Reactions
  • Electronic Components
  • Electronic Equipment
  • Failure Mode And Effect Analysis
  • Film Resistors
  • Films
  • Fixed Resistors
  • Metal Films
  • Oxidation
  • Resistors

Readers

  • Combustion science or combustion engineering.
  • Integrated Circuit Design and Technology.