STUDY OF COMPREHENSIVE FAILURE THEORY.

Abstract

Principal operative mechanisms contributing to the degradation of Evanohm deposited film resistors are identified. Studies of oxidation kinetics are described, chemical analysis are given, and evidence of the influence of film thickness on reliability testing is presented. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1965
Accession Number
AD0474420

Entities

People

  • A. Horberg
  • F. Hand
  • M. Goldberg
  • N. Parikh

Organizations

  • IIT Research Institute

Tags

DTIC Thesaurus Topics

  • Chemical Analysis
  • Degradation
  • Electronic Components
  • Electronic Equipment
  • Film Resistors
  • Fixed Resistors
  • Kinetics
  • Oxidation
  • Passive Electronic Components
  • Reliability
  • Resistors
  • Thickness

Readers

  • Structural Health Monitoring of Composite Structures.
  • Thin Film Deposition Science.