DORMANT OPERATING AND STORAGE EFFECTS ON ELECTRONIC EQUIPMENT AND PART RELIABILITY.
Abstract
The importance of storage or non-operating mode failure rate data for electronic component parts has been underscored in recent years with the deployment of electronic equipment and of missiles in silos, in the field, or in depots throughout the United States of America and the rest of the world. This report describes how a failure rate chart, which is applicable to component parts obtained from MIL-STD sources of supply, has been constructed for the non-operating mode. In combination with data accumulated at Martin Orlando through storage tests of missiles, of missile sections, and of printed circuit boards, the technique of ranking analysis was used to develop the non-operating failure rate chart. The failures uncovered to date indicate that storage screens out or precipitates latent manufacturing defects. It may, therefore, be inferred that component parts of a higher quality than those available from MIL-STD sources would have proportionally lower failure rates. No representative aging failure mechanisms have been found. Thus, the failure rate chart may also be useful as a starting point for evaluating the storage mode of high reliability parts such as the established reliability parts used on Minuteman, the 39,000 series of parts sponsored by DOD, or the 38,000 series of parts used by the Air Force. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1965
- Accession Number
- AD0474614
Entities
People
- John Bauer
- Robert Dietz
- William Hadley