ACCELERATED TEST PROGRAM - VOLUME I.
Abstract
A review of data and information gathered during previously conducted accelerated test programs has led to the formulation of degradation models for the parts under study. Long term constant stress tests, which were inactive for a 10 month period after accumulating 5000 to 9000 hours of test time at various stress conditions, were restarted and accumulated an additional 8000 hours. An accelerated test design and analysis plan was formulated which is applicable to all electronic parts which exhibit chemical degradation. Failure Mechanism Studies led to the formulation of a current conduction model and breakdown model for glass dielectric capacitors. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 10, 1965
- Accession Number
- AD0476301
Entities
People
- Graeme Best
- H. Mclean
- H. S. Endicott
- T. M. Walsh
Organizations
- General Electric