ACCELERATED TEST PROGRAM. VOLUME II.
Abstract
Accelerated step stress and constant stress tests were performed on resistors, capacitors, transistor and diodes. Failure/mechanism studies of each of the parts tested are discussed in detail. A recommended accelerated testing and analysis plan is shown which is applicable to chemical degradation processes found in electronic parts. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 10, 1965
- Accession Number
- AD0476307
Entities
People
- T. M. Walsh
Organizations
- General Electric