DESIGN AND DEVELOPMENT OF SEMICONDUCTOR TEST SET, AN/USM-171().
Abstract
Fabrication and testing of two advanced development models of the AN/USM-171 was accomplished. Desirable mechanical changes for the five (5) service test models was established and the in-circuit leakage test circuitry was refined to reduce possible operator error when performing the test. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1965
- Accession Number
- AD0476587
Entities
People
- P. M. Kurland
- T. B. Stavely
- T. J. Ryan