STUDY OF EFFECT OF HIGH-INTENSITY PULSED NUCLEAR RADIATION ON ELECTRONIC PARTS AND MATERIALS (SCORRE).

Abstract

The effects of reactor radiation and LINAC irradiation on the dielectric properties of several common capacitors are compared. The dependence of the induced currents generated on applied voltage, geometry, dose, and dose-rate, is contrasted for mylar, polystyrene, mica, tantalum, glass, and ceramic capacitors. These effects are analyzed in terms of models appropriate for the various capacitors and their associated parameters are defined. Induced currents in irradiated thin-film resistors are principally due to secondary emission and air ionization. Static tests of ferrite core memory planes and magnetic tape were conducted at LINAC. The purpose was to determine whether these materials would retain stored information after radiation exposure. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1966
Accession Number
AD0477693

Entities

People

  • Frank A. Frankovsky
  • Morris Shatzkes

Organizations

  • International Business Machines Corporation (Armonk, NY)

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Capacitors
  • Ceramic Capacitors
  • Dielectric Polymers
  • Dielectric Properties
  • Dose Rate
  • Electronic Components
  • Ferrites
  • Film Resistors
  • Films
  • Magnetic Tape
  • Materials
  • Nuclear Radiation
  • Radiation
  • Resistors
  • Secondary Emission
  • Thin Film Resistors
  • Thin Films

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Nuclear and Radiation Engineering.
  • Theoretical Analysis.

Technology Areas

  • Microelectronics