EFFECT OF MICROELECTRONICS ON RELIABILITY OF THE AN/ASQ-19 SYSTEM.

Abstract

The reliability study of the integrated electronic central AN/ASQ-19 revealed that the large potential contribution of microelectronic circuits to reliability improvement could not be realized at the system level without drastic improvements in the many electromechanical functions used in the AN/ASQ-19. Similar conclusions were reached in relation to gains in size and weight. The study of maintenance actions and the evaluation of down time under various conditions of maintenance revealed that the problem of introducing the microelectronic devices into the existing maintenance and logistic supply organization is one of considerable magnitude; therefore, it was concluded that novel logistic methods must be considered. A method of logistic self-support is presented in this report as an example. This method has the great advantage of not requiring the imposition of strict standardization practices. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 31, 1963
Accession Number
AD0478245

Entities

People

  • E. R. Jervis
  • H. Dagen

Organizations

  • ARINC

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Maintenance
  • Microelectronics
  • Reliability
  • Standardization
  • Test And Evaluation

Readers

  • Integrated Circuit Design and Technology.
  • Life Cycle Cost Analysis
  • Systems Analysis and Design

Technology Areas

  • Microelectronics