INVESTIGATION OF RELIABILITY TESTING AND PREDICTION TECHNIQUES FOR INTEGRATED CIRCUITS.
Abstract
The circuit studies program has two main objectives: To determine the design factors affecting the reliability of integrated circuits, and to develop electrical measurements which are more sensitive to degradation and more useful for reliability prediction than standard functional tests. A typical digital integrated circuit, the SN5420 dual NAND gate, has been selected for study. The program consists of a detailed analysis of this circuit, the results of which are expected to apply to a broad range of similar devices. The analysis includes both theoretical and experimental studies. The theoretical analysis is performed on a digital computer, using a program which is capable of dc and ac analysis of linear circuits and transient analysis of nonlinear circuits. Physics of failure activities involved surface studies and circuit analysis. In surface studies, (1) sodium and HF contamination of thermal oxides were measured; (2) MOS capacitors with various oxides were characterized before and after thermal-electrical stress; (3) models for the oxide structure and instability are postulated. Circuit studies examined the design factors affecting reliability of integrated circuits and considered electrical measurements more useful to reliability prediction than standard functional tests. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1966
- Accession Number
- AD0479895
Entities
People
- Harold G. Carlson
- Joseph E. Hall
- Walter L. Gill
- Wayne V. Murdock
Organizations
- Texas Instruments