FLUX-TRAPPING MODEL FOR R-F LOSSES IN SUPERCONDUCTORS.

Abstract

Measurements on superconductive resonant circuits in the frequency range from 10 - 1000 Mc/sec indicate that flux-trapping of the rf magnetic fields is responsible for residual loss, not predicted by surface resistance theories. A simple model, based on flux-trapping at local sites, predicts such a loss for both type I and type II materials. The surface resistance due to flux-trapping is shown to be proportional to frequency, the density of trapping centers, the penetration depth, and a 'threshold' function of the rf magnetic field. Experimental data are given for several materials, verifying the salient features of the model. It is also concluded that the flux-trapping centers are a common nature. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 16, 1965
Accession Number
AD0479992

Entities

People

  • Clovis Roland Haden
  • William H. Hartwig

Organizations

  • University of Texas at Austin

Tags

DTIC Thesaurus Topics

  • Circuits
  • Experimental Data
  • Frequency
  • Magnetic Fields
  • Materials
  • Measurement
  • Residuals
  • Resistance
  • Resonant Circuits
  • Resonant Frequency
  • Superconductors

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Electronics Engineering
  • Superconducting Magnet Technology