LOW DENSITY ABLATION MATERIALS SURVEY

Abstract

A survey of 12 low density ablators for thermal protection of lifting reentry vehicle surfaces was conducted. Eithty-nine arc tunnel tests were performed. The primary series of tests was performed to determine temperature response- and recession-characteristics at cold wall calorimeter heat flux levels of 20, 60, 90, 120, and 150 Btu/sq ft. sec. A second series of tests was performed to indicate the response of low density ablators to aerodynamic shear. The results of these tests are evaluated relative to the thermal protection requirements for ablative lifting bodies for reentry systems. The materials tested were found to have insulating characteristics comparable to idealized heat conductors with thermal diffusivities between 0.000002 and 0.000007 sq ft/ sec in the nonrecession regime. In some materials the apparent diffusivity tended to rise during the test. In the range of heat fluxes where surface recession occurred, only small differences in recessions were observed between materials. Two materials receded at a heat flux of 60 Btu/sq ft. sec, whereas the other materials did not recede at heat flux levels below 90 Btu/sq ft. sec.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1966
Accession Number
AD0480846

Entities

People

  • D. H. Leeds
  • J. I. Slaughter
  • K. E. Starner
  • W. E. Welsh

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Energy and Power Technologies
  • Human Systems
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Ablative Materials
  • Composite Materials
  • Heat Flux
  • Heat Transfer
  • Lifting Bodies
  • Low Density
  • Materials
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Measurement
  • Photographs
  • Reentry Vehicles
  • Space Systems
  • Test Facilities
  • Thermal Diffusivity

Fields of Study

  • Physics

Readers

  • Fluid Dynamics.
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics