THIN FILM MICROCIRCUITS FOR ROCKETSONDE.

Abstract

Sample thin film resistors fabricated during the first quarter were subjected to load life, short-time-overload and temperature cycling. Temperature coefficients of resistance were measured over the 100 to 700 ohms per square resistivity range. A method of physical adjustment of capacitors was evaluated along with unadjusted control units. Capacitors were subjected to D.C. Bias measurements to assess behavior over bias range -30 to +30 volts. Circuits Engineering on the R.F. portion of the radiosonde centered on 2N3866 Transistor Oscillator as Doubler (860 to 1680 MHz), Tripler (560 to 1680 MHz) and various other means to achieve output in 1680 MHz range with required power output. Power Output and efficiencies of the various approaches are compared. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1966
Accession Number
AD0482203

Entities

People

  • A. Juster
  • A. Smith
  • B. J. Patton

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Capacitors
  • Coefficients
  • Electrical Resistance
  • Engineering
  • Film Resistors
  • Films
  • Measurement
  • Resistance
  • Resistors
  • Temperature Coefficients
  • Thin Film Resistors
  • Thin Films
  • Transistors

Readers

  • Electronics Engineering
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics