BURNOUT RESISTANT X BAND HOT CARRIER DETECTORS.

Abstract

Gold with N type impurity alloyed into high resistivity N type silicon produced junctions which are best understood in terms of the Schottky Barrier model. As video detectors of square wave modulated microwave energy at 9.3 GHz, .001 in. diameter junction of N+ on N showed a TSS of -43 DBM with forward bias. With reverse bias, the same junction showed reversal in sign of the detected output with lower sensitivity. Epitaxial regrowth N+ on N junctions also showed the same reversal. The regrowth devices were generally less sensitive than the alloyed metal on semiconductor devices. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1966
Accession Number
AD0483734

Entities

People

  • D. Scaringella
  • S. Denker

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Detectors
  • Diameters
  • Electronics
  • Impurities
  • Microwaves
  • Semiconductor Devices
  • Semiconductors
  • Sensitivity
  • Solid State Electronics
  • Square Waves
  • Waves
  • X Band

Fields of Study

  • Materials science

Readers

  • Electronics Engineering
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics