BASIC MECHANISMS OF TRANSIENT RADIATION EFFECTS IN THE THIN FILM TRANSISTOR.

Abstract

This program includes studies of active device intrinsic response and has as its broad objective the study of this intrinsic response for the majority carrier thin-film transistor. For this study fundamental solid state behavior is described in terms of active device circuit parameters and leads ultimately to radiation hard circuit design by manipulation of device design parameters.

Document Details

Document Type
Technical Report
Publication Date
May 31, 1966
Accession Number
AD0483756

Entities

People

  • C. C. Berggren
  • J. R. Shackleton
  • R. R. Emmert
  • V. R. Honnold
  • W. M. Peffley

Organizations

  • Hughes Aircraft Company

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Films
  • Radiation
  • Radiation Effects
  • Thin Film Transistors
  • Thin Films
  • Transistors

Readers

  • Integrated Circuit Design and Technology.
  • Theoretical Analysis.