NON-DESTRUCTIVE RELIABILITY SCREENING OF TANTALUM CAPACITORS.
Abstract
A study of the physics of failure of solid electrolyte tantalum capacitors showed that degradation of the dielectric resulted in increases in leakage current and ultimate failure of the device. Screening tests, devised to detect potential failures, required measurements of leakage current under certain specific conditions. A screening test was devised which effectively reduced the incidence of failures on production lots of liquid electrolyte tantalum capacitors. Potential failures were selected by dissipation factor measurements before and after electrical aging. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1966
- Accession Number
- AD0484189
Entities
People
- L. Howard