NON-DESTRUCTIVE RELIABILITY SCREENING OF SEMICONDUCTOR DIODES.

Abstract

Over 11,000, 1N971-3 diffused junction silicon zener diodes were screened and life tested. Failure analysis was performed on failed devices to determine existing failure mechanisms so that the most beneficial screen could be established. In addition, a cost model was developed to functionally relate screening to the reliability required by the user of the diodes. The results of these investigations, including the final form of a linear discriminate function developed to classify initial units as superior or inferior, are presented in this report. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1966
Accession Number
AD0484278

Entities

People

  • Kenneth W. Davidson

Organizations

  • Motorola Mobility

Tags

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Cost Models
  • Costs
  • Diodes
  • Electronics
  • Failure Analysis
  • Failure Mode And Effect Analysis
  • Reliability
  • Semiconductor Devices
  • Semiconductor Diodes
  • Semiconductors
  • Solid State Electronics
  • Zener Diodes

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Software Engineering
  • Systems Analysis and Design

Technology Areas

  • Microelectronics