IDENTIFICATION OF MICROSTRUCTURAL CONSTITUENTS AND CHEMICAL CONCENTRATION PROFILES IN COATED REFRACTORY METAL SYSTEMS.

Abstract

Coated refractory metal systems exposed to high temperatures at atmospheric pressure and at low pressures were surveyed to reveal resultant microstructure and chemical concentration profiles for interpretation of coating behavior under high-temperature oxidizing conditions. Identification of the constituents of coatings and substrates before and after oxidation is carried out mainly by electron probe techniques supplemented by x-ray diffraction. Representative substrates chosen for study include the pure metals and alloys based on Cb, Mo, Ta and W. The coatings include a selection of commercially available materials ranging from pure silicides to silicides modified with with one to three additives in trace and bulk amounts. (Author)

Document Details

Document Type
Technical Report
Publication Date
May 01, 1966
Accession Number
AD0484609

Entities

People

  • D. J. Bracco

Tags

DTIC Thesaurus Topics

  • Barometric Pressure
  • Coatings
  • Diffraction
  • Electron Probes
  • High Temperature
  • Identification
  • Materials
  • Metals
  • Refractory Metals
  • Substrates
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Fluid Dynamics.
  • Spectroscopy.
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene