EVALUATION PROCEDURES FOR RELIABILITY, MAINTAINABILITY. AND EFFECTIVENESS OF MICROELECTRONICS.
Abstract
This is the final report on a study conducted to define and detail the present practices, characteristics and problems of the microelectronic industry relevant to the establishment of evaluation procedures for microelectronic components and equipment. Both manufacturers and users of semiconductor integrated circuits and film hybrid circuits were surveyed. Several significant conclusions have been derived from the survey experience and are reported. However, by far the dominant finding is a critical need for standardization in the integrated circuit area. This is particularly true in the dimensional aspect of device packaging and in the reliability testing area of procurement specifications. The need for standardization is twofold. First, reliability and cost effectiveness of present and future microelectronic components and equipment can be improved considerably as a result of such standardization. Second, such standardization would reduce the intuitive content of any comparative evaluation of microelectronics by providing additional quantitative bases for evaluation procedures. The beneficial effects of standardization will be felt in major military systems involving high production volume. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1966
- Accession Number
- AD0485078
Entities
People
- C. Casey
- D Faulis
- D. Beadling
- D. Dunne
- M. Hornstein