AN ULTRA HIGH TEMPERATURE, SINGLE CRYSTAL TEXTURE CAMERA DIFFRACTOMETER.

Abstract

A single-crystal high-temperature X-ray camera has been built with permissible operating temperatures of 3000 C. The camera is constructed to rest upon a Siemens horizontal diffractometer and may be used with either an external electronic detector or with film. The sample is supported on an externally adjustable goniometer head and is heated from the back by an ion beam. Controlled oscillation allows rotation photographs to be obtained from the sample surface not touched by the ion stream. Temperature is controlled by a thermocouple supporting the sample, the thermocouple being an intrinsic part of the goniometer. As a design limit, zero and first order layer lines with iron K-alpha radiation on specimens with lattice parameters of 2.6 A or larger may be recorded. Copper, cobalt, and molybdenum radiation allow even greater latitude. Types of samples that may be studied include powder (pellet), single crusta;. wire, or rod. The camera serves equally well for single crystal, texture, or powder studies on refractory materials. (Author)

Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1966
Accession Number
AD0486395

Entities

People

  • Robert L. Prickett

Organizations

  • Air Force Research Laboratory

Tags

DTIC Thesaurus Topics

  • Advanced Materials
  • Cameras
  • Crystals
  • Detectors
  • Diffractometers
  • Goniometers
  • Heat Resistant Materials
  • High Temperature
  • Ion Beams
  • Ions
  • Materials
  • Photography
  • Radiation
  • Refractory Materials
  • Single Crystals
  • X Rays

Fields of Study

  • Physics

Readers

  • Geodesy
  • Nanofabrication and Microfabrication.
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Microelectronics - Microelectromechanical Systems