FAILURE MECHANISMS IN RESISTORS

Abstract

This report describes some results of research on failure mechanisms in thin metal film resistors. The effort is to develop mathematical expressions for these mechanisms which can be assembled into a comprehensive model for this class of device. The report describes the early results of analysis of nichrome resistor life test data obtained from a manufacturer of resistive networks. Also presented are the results of computer analysis of Matrix II life test data on Evanohm resistors indicating that the model must contain separable functions of time and the experimental variables (stresses, initial resistance, etc.). The experimental work described involves an attempt to statistically design an experiment to give the maximum number of degrees of freedom in estimating error and in constructing a model.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1966
Accession Number
AD0486980

Entities

People

  • A. Horberg
  • F. R. Hand

Organizations

  • IIT Research Institute

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Classification
  • Contracts
  • Electronic Components
  • Electrons
  • Engineering
  • Failure Mode And Effect Analysis
  • Film Resistors
  • Films
  • Government (Foreign)
  • Governments
  • Heat Of Activation
  • Life Tests
  • Partial Pressure
  • Reliability
  • Standards
  • Thin Films

Fields of Study

  • Engineering

Readers

  • Software Engineering
  • Systems Analysis and Design
  • Thin Film Deposition Science.