PROGRAMMED ALGORITHM FOR TEST-POINT SELECTION AND FAULT ISOLATION. VOLUME 1.
Abstract
This report presents the methods and results of a study to develop a computer algorithm for automatically selecting test point locations in an electronic circuit, for generating test measurements, and for designing a corresponding test procedure. The algorithm is oriented towards analog circuits where piece-part fault isolations are made using sequential tests which can be performed either manually or on tape-controlled automatic test equipment. The present algorithm, which is programmed in FORTRAN IV for the IBM 7094 computer, represents an extension and enhancement of the algorithm previously developed in the following four areas: (1) minimiazation of the program running time, (2) improvement accuracy of computation and of transistor and diode processing, (3) extension of application to larger circuits and to include transformers and polarized capacitors, and (4) improved efficiency of the algorithm - generated test procedures. The output from the computer program includes (1)a specification of necessary test-point locations and (2) a sequential test procedure including measured nominal values and test limits under both good and faulty circuit conditions.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1966
- Accession Number
- AD0487520
Entities
People
- R. F. Barry
- R. R. Mattison
- R. S. Fisher