MEASUREMENTS OF SILICON PHOTODIODE CHARACTERISTICS UNDER BACKGROUND RADIATION CONDITIONS.

Abstract

The performance characteristics of the silicon photodiode under different background conditions are evaluated experimentally and, to a lesser degree, analytically. The performance characteristics investigated are responsivity, frequency response (time constant), noise-equivalent power, spectral response, and dynamic impedance. In the tests, these characteristics were measured with the diode subjected to direct sunlight and to various levels of simulated sunlight. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1964
Accession Number
AD0600032

Entities

People

  • C. M. Kaloi

Organizations

  • Naval Ordnance Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Background Radiation
  • Diodes
  • Electromagnetic Radiation
  • Frequency
  • Frequency Response
  • Impedance
  • Light (Electromagnetic Radiation)
  • Measurement
  • Photodiodes
  • Radiation
  • Solar Radiation
  • Sunlight

Readers

  • Atmospheric Remote Sensing.
  • Semiconductor Device Technology
  • Structural Dynamics.

Technology Areas

  • Directed Energy