PRODUCTION ENGINEERING MEASURES TO INCREASE TRANSISTOR RELIABILITY
Abstract
Topics include: epitaxial growth control; surface preparation of substrates for growth; epitaxial continuity control; diffusion control to eliminate resistivity product problem; protective coating techniques for surface passivation; cleaning techniques to obtain optimum surface conditions for all fabrication processes; welding techniques for encapsulation and sealing; controlled formation of surface oxide for surface stabilization; protective inert coatings for surface stabilization; evaporation control; mesa and dice cutting; piece part incoming inspection procedures; post can stressing; and quality assurance testing.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 30, 1963
- Accession Number
- AD0600645
Entities
Organizations
- Texas Instruments