MEAN FREE PATH AND BOUNDARY INFLUENCES IN THE METALLIC FIELD EFFECT.

Abstract

The change in surface conductance due to the metallic field effect was calculated for various simple thin film models which take into account that the penetration depth of applied fields in metals is very small, and that mean-free-path effects are important in the very thin films in which the field effect is observable. Comparison with experiment of the behavior to be expected due to effective changes in surface scattering, surface charge density, or film thickness shows that the latter mechanism seems to be predominant. Predictions of this model regarding the magnitude of the field effect are given. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1964
Accession Number
AD0600681

Entities

People

  • H. J. Juretschke

Organizations

  • New York University Tandon School of Engineering

Tags

DTIC Thesaurus Topics

  • Boundaries
  • Charge Density
  • Electricity
  • Films
  • Mean Free Path
  • Scattering
  • Thickness
  • Thin Films

Fields of Study

  • Physics

Readers

  • Plasma Physics / Magnetohydrodynamics
  • Thin Film Deposition Science.