KA-BAND CRYSTAL PROTECTOR.

Abstract

An analysis is made of two life tests conducted during the quarter on combination pre TR-crystal protector TR tubes. The results indicate that the keep alive is the limiting factor of operational life expectancy. Additional work on two and three element pre TR tubes is summarized, and the advantages and drawbacks of the two possible approaches are shown. The problem of high insertion loss of present PIN switches is presented. Methods of improving this loss - in view of the lower isolation needed in a gas-solid state combination device are discussed. A preliminary life test on such a device shows promising results. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 15, 1964
Accession Number
AD0601428

Entities

People

  • Paul Basken

Organizations

  • M/A-COM Technology Solutions

Tags

DTIC Thesaurus Topics

  • Insertion Loss
  • Ka Band
  • Life Tests
  • Losses

Fields of Study

  • Physics

Readers

  • Electronics Engineering
  • Systems Analysis and Design