REFLECTOMETER FOR DETERMINING OPTICAL CONSTANTS.
Abstract
This report describes a reflectometer that uses linearly polarized incident radiation and permits the measurement of the ratio R = polarized parallel/perpendicular as a function of the angle of incidence, including the minimum ratio corresponding to the pseudo Brewster angle. Special features are: (1) the source and detector are mounted in fixed positions and (2) the reflectometer can be mounted in a cryogenic apparatus. It is shown that the resulting data can be reduced to give with precision the pseudo Brewster angle phi sub B (or the quantity sq X sub B = sq sin phi sub B sq tan phi sub B), as well as the minimum value of R at phi sub B (R sub B). With these two parameters, the optical constants can be determined in an analytical manner for a specular sample that can be characterized as having a complex dielectric constant epsilon = epsilon sub 1 + i epsilon sub 2. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 15, 1964
- Accession Number
- AD0601646
Entities
People
- R. F. Potter
Organizations
- Naval Ordnance Laboratory