PRODUCTION ENGINEERING MEASURES TO INCREASE TRANSISTOR RELIABILITY. 2N960 SERIES.
Abstract
This report covers all work performed on production engineering measures to increase transistor reliability during the contract period May 1, 1963 to January 31, 1964. Process improvement work was done and reliability testing performed. Improvements were installed throughout the process to gain better control on manufacturing steps, and to reduce operator dependency. Process modifications were also made to enhance the effectiveness of operations. Acceptance criteria for both manufacturing and quality control inspection operations have been more specifically defined and tightened. This assures the end product to be more uniform and provides an improved ability to separate out the mavarick devices which contribute to the failure rate. Reliability testing on a total of 2200 transistor at three power levels; one, one and onehalf, and twice maximum rated power, has shown an extrapolated failure rate that is less than 0.01% per 1000 hours at 25C with a 90% confidence level. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 03, 1964
- Accession Number
- AD0601956
Entities
Organizations
- Texas Instruments