MEASUREMENT OF RESIDUAL STRESS BY X-RAY DIFFRACTION.

Abstract

For the measurement of residual stresses, x-ray diffraction is potentially the best nondestructive method available. Ex periments are described in which silicon bronze and alpha brass samples were examined by x-rays while subjected to tensile deformation. The positions of the diffraction lines and their breadths were measured and analyzed. The special features of the experimental arrangement employed are presented and the method of analysis explained. An important result of this study is the observation that the stress-strain curve obtained from the x-ray diffraction measurements follows the stress-strain curve obtained from a standard tensile test, contrary to what many previous investigators have reported with different experimental techniques. Furthermore, for materials which may form stacking faults upon deformation, the x-ray data must first be corrected for the effects produced from stacking faults before the stress is calculated. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1964
Accession Number
AD0602114

Entities

People

  • A. L. Esquivel
  • H. M. Otte

Tags

DTIC Thesaurus Topics

  • Advanced Materials
  • Diffraction
  • Engineered Materials
  • Materials
  • Materials Science
  • Measurement
  • Residual Stress
  • Residuals
  • Stress Strain Relations
  • Stresses
  • X Rays
  • X-Ray Diffraction

Readers

  • Mechanical Engineering/Mechanics of Materials.
  • Structural Dynamics.
  • Thin Film Deposition Science.