EXPERIMENTAL INTEGRATED CIRCUITS FOR SWITCHBOARDS,

Abstract

Selected silicon integrated circuits designed for switching and multiplexing equipments are investigated under severe temperature and nuclear environments. The amount of temporary and permanent damage is assessed and the circuits are given a comparative functional test with the discrete component circuits they were designed to replace. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1964
Accession Number
AD0602149

Entities

People

  • Albert L. Bramble
  • Jere W. Hohmann
  • Russell A. Gilson

Organizations

  • United States Army Communications-Electronics Command

Tags

DTIC Thesaurus Topics

  • Circuit Testers
  • Circuits
  • Determinants (Mathematics)
  • Electronic Equipment
  • Environment
  • Integrated Circuits
  • Multiplexing
  • Switchboards
  • Switching
  • Test Equipment

Readers

  • Electrical Engineering
  • Semiconductor Device Technology
  • Software Engineering