APPLICATION OF THIN-FILM ELECTRON MICROSCOPY TO REFRACTORY METAL PROCESSING.

Abstract

Results of a program to correlate substructural effects of refractory metal processing by transmission electron microscopy are presented. The results of deforming commercially pure tantalum by cold rolling are comparable to the results obtained with tantalum deformed in tension. Preliminary results of cold rolling tantalum show that dislocation arrays do not increase proportionally with the degree of cold work. On the other hand, cell structure becomes more fully defined with increasing deformation. As in tension, it was found that the grain boundaries can act either as sinks or sources for dislocation, depending upon the amount of deformation. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jul 11, 1964
Accession Number
AD0603127

Entities

People

  • R. P. Jewett

Organizations

  • Rocketdyne

Tags

DTIC Thesaurus Topics

  • Cell Structure
  • Dislocations
  • Electron Microscopy
  • Electrons
  • Grain Boundaries
  • Metals
  • Microscopy
  • Refractory Metals
  • Tantalum
  • Thin Films
  • Transmission Electron Microscopy

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics