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Abstract

This report discusses work on a 6-Gc low-power germanium transistor, the image force dielectric constant for hot electrons in gold n-type silicon Schottky diodes, and aging of silicon resistors. Status of the work on a 6-Gc low-power germanium transistor is reported. Techniques for fabricating the oxide-photoengraved planar structure are evaluated. Results of a computer analysis of effects of header parasitic impedances are presented. Photoelectric measurements of the bias dependence of the potential energy barrier for electrons in gold n-type silicon Schottky diodes show that the value of the image force dielectric constant deduced from direct measurement of the barrier lowering is 12.0 = 0.5, in close agreement with the infrared dielectric constant of silicon, and independent of the applied field for fields between 10,000 volts/cm and 2x100,000 volts/cm. Silicon resistors have been aged 1000 hours at 350C. Values remained within about 1 per cent of initial values. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 30, 1964
Accession Number
AD0603355

Entities

People

  • C. R. Crowell
  • D. Kahng
  • J. Kocsis
  • K. E. Martersteck
  • M. P. Lapselter

Tags

DTIC Thesaurus Topics

  • Agreements
  • Computers
  • Dielectric Permittivity
  • Diodes
  • Electrical Impedance
  • Electrical Properties
  • Electricity
  • Electronic Components
  • Electrons
  • Germanium
  • Impedance
  • Measurement
  • Planar Structures
  • Potential Energy
  • Resistors
  • Schottky Diodes
  • Transistors

Fields of Study

  • Materials science

Readers

  • Integrated Circuit Design and Technology.
  • Mathematics or Statistics
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics