A MEASUREMENT TECHNIQUE FOR VACUUMDEPOSITED THIN FILMS,

Abstract

This report presents a laboratory method for the measurement of evaporated thin films in the range 10 to 10,000 Angstroms. Utilizing a multiple beam technique, employing fringes of equal chromatic order and a unique sample holder, films have been measured to a precision of = 15 A. The simplicity of the components employed is an outstanding feature of the experimental system. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1964
Accession Number
AD0603706

Entities

People

  • Phillip A. Newman
  • Richard F. Sette

Organizations

  • United States Army Communications-Electronics Command

Tags

DTIC Thesaurus Topics

  • Buildings And Structures
  • Films
  • Measurement
  • Precision
  • Research Facilities
  • Thin Films

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Thin Film Deposition Science.