TECHNIQUES FOR IDENTIFICATION HANDLING AND ANALYSIS OF EXTRA-TERRESTRIAL PARTICLES.

Abstract

A technique is described for inflight shadowing of collected upper atmosphere particles which enables the discrimination of contamination particles from extra-terrestrial particles. A method of transferring sub-micron particles from the electron microscope substrates to beryllium discs for chemical analysis employing the electron probe is also described. Electron microscopic examination of samples from a rocket collection and size distribution of the collected particles is presented and evaluated. Electron probe qualitative analysis of a number of collected particles after transfer to a beryllium disc has demonstrated the feasibility of this technique as an aid in particle identification. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 30, 1964
Accession Number
AD0603964

Entities

People

  • M. Plansky
  • R. F. Carnevale

Tags

DTIC Thesaurus Topics

  • Atmospheres
  • Beryllium
  • Chemical Analysis
  • Contamination
  • Discrimination
  • Electron Microscopes
  • Electron Probes
  • Electrons
  • Identification
  • Inflight
  • Microscopes
  • Particles
  • Probes
  • Substrates

Readers

  • Aerosol Science/Aerosol Physics
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene