THE IMPROVEMENT OF PRODUCTION TECHNIQUES TO INCREASE THE RELIABILITY OF DIFFUSED SILICON CONTROLLED SWITCHES TYPES 2N689.

Abstract

The report covers work performed on the device package ultrasonic welding, the tests being conducted to determine the optimum tubulation weld schedules, the evaluation of completed high-speed low-voltage all-diffused devices, the experiments conducted to re-establish gold diffusion conditions, the comparison of material from four different N-type silicon crystals and their effect on pulse turn-off times, and the summary of blocking voltage step stress test data on the alloy-diffused device. A PERT analysis depicts the progress of this program, and provides for certain conclusions based upon the work performed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 30, 1964
Accession Number
AD0604734

Entities

People

  • A. Hishta
  • H. Wawrousek
  • J. N. Frank
  • R. C. Rome
  • W. R. Comstock

Organizations

  • General Electric

Tags

DTIC Thesaurus Topics

  • Diffusion
  • Low Voltage
  • Materials
  • Materials Testing
  • Performance (Engineering)
  • Production
  • Reliability
  • Stress Tests
  • Test And Evaluation
  • Ultrasonic Welding
  • Voltage
  • Welding
  • Welds

Readers

  • Electrical Engineering
  • Semiconductor Device Technology
  • Software Engineering