INTEGRATED CIRCUIT STUDY.
Abstract
The possibility of replacing state-of-the-art multi-chip circuits currently used in the CP667 computer with newly developed monolithic circuits was investigated. Multi-chip units of the variety used in the CP667 from two manufacturers were investigated. To further investigate monolithic characteristics, three other monolithic circuit types, two from a third manufacturer, were studied. One unit of each of the ten types was opened for structural analysis. Similarly each unit which failed catastrophically during the various stresses was opened and the cause of failure was determined. Stresses included a series of incoming tests to establish a basis of comparison, operating life tests, a series of environmental stresses, and performance testing. On the basis of the tests it was concluded that the Westinghouse monolithic DTL circuits approached the standard required for multi-chip circuits in the CP667. Failure analysis revealed that most failures were associated with wire bonds. The larger number of leads in multi-chip circuits increased the chances of failure in these units. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1964
- Accession Number
- AD0605432
Entities
Organizations
- Sperry Corporation