THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUND-BASED COMPUTER SYSTEMS: VOLUME VI: PHASE III, THE DEVELOPMENT OF COMPONENT-SCREENING TECHNIQUES.

Abstract

This report describes a research program directed toward the development of techniques for detecting inherently weak transistors, diodes, and resistors before they are used in the computer system. The results of this research have indicated that screening techniques based on initial parameter measurements are feasible. Trail applications of the techniques on data from exploratory and simulated-use life tests indicate that it may be possible to classify correctly as many as 80 per cent of the components destined for early failure in use. (Author)

Document Details

Document Type
Technical Report
Publication Date
Mar 31, 1958
Accession Number
AD0605625

Entities

People

  • H. M. Braner
  • J. E. Drennan
  • K. E. Hassler
  • R. E. Thomas
  • W. E. Chapin

Organizations

  • Battelle Memorial Institute

Tags

DTIC Thesaurus Topics

  • Active Electronic Components
  • Computers
  • Electronic Components
  • Electronic Equipment
  • Ground Based
  • Life Expectancy (Service Life)
  • Life Tests
  • Measurement
  • Reliability
  • Resistors
  • Transistors

Readers

  • Computer Science.
  • Electronics Engineering
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems