THE STRUCTURE AND STRENGTH OF EPITAXIAL FILMS.

Abstract

The main effort during this report period has been the design of a tensile device to facilitate stress-strain measurements on free epitaxial films and the development of techniques for removing the substrate from such films. In addition, the evaporation oven has been rebuilt so that only the inner wall of the crucible is exposed to UHV. Lower operating pressures may now be maintained during evaporation. Gold films have been deposited on aluminum, silver, NaCl, and mica crystals and their structure is being studied. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 25, 1964
Accession Number
AD0605850

Entities

People

  • Melvin Lavik
  • Paul J. Bryant
  • Paul Stablein

Organizations

  • MRIGlobal

Tags

DTIC Thesaurus Topics

  • Aluminum
  • Crucibles
  • Evaporation
  • Measurement
  • Pressure Measurement
  • Substrates

Readers

  • Materials Science and Engineering.
  • Software Engineering
  • Thin Film Deposition Science.