CONFIDENCE LEVELS FOR THE SAMPLE MEAN AND STANDARD DEVIATION OF A RAYLEIGH PROCESS

Abstract

The number of independent samples necessary to characterize the parameters of a Rayleigh-distributed process within arbitrary confidence limits is derived. Stationarity of the process is assumed, along with convergence of the Central Limit theorem with regard to the probability density function of the sample mean. Perfect measurement ability is also assumed. A graph of sample size for a range of confidence coefficients and error limits is presented.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1964
Accession Number
AD0606556

Entities

People

  • Leo M. Keane

Organizations

  • Air Force Cambridge Research Laboratories

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes
  • Weapons Technologies

DTIC Thesaurus Topics

  • Charge Transfer
  • Confidence Limits
  • Data Science
  • Detectors
  • Electromagnetic Radiation
  • Electron Transfer
  • Far Field
  • Gaussian Distributions
  • Gaussian Noise
  • Gaussian Processes
  • Information Science
  • Mass Spectrometers
  • Physical Sciences
  • Physics Laboratories
  • Probability
  • Probability Density Functions
  • Random Variables

Fields of Study

  • Mathematics

Readers

  • Regression Analysis.
  • Statistical inference.