STRUCTURE IN TEXTURED GOLD FILMS.

Abstract

Gold films deposited by evaporation onto amorphous substrates at a wide variety of temperatures were examined by x-ray and electron-reflection diffraction, as well as by resistivity measurements. It was found that: (a) the (111) texture predominates at all deposition temperatures and appears almost exclusively between 370 and 500C; (b) the hexagonal partial structure, first noted by others in cold-worked bulk gold, appears in electron diffraction in this temperature range, along with the forbidden (110) reflection; (c) the deposition process introduces large concentrations of vacancies, which cluster under annealing into quite stable complexes. A large observed increase in resistivity and a contraction of the lattice as measured by x-ray diffraction are related to these vacancies. (Author)

Document Details

Document Type
Technical Report
Publication Date
Sep 04, 1964
Accession Number
AD0606827

Entities

People

  • J. E. Davey
  • R. H. Deiter

Organizations

  • United States Naval Research Laboratory

Tags

DTIC Thesaurus Topics

  • Annealing
  • Diagrams
  • Diffraction
  • Electron Diffraction
  • Electrons
  • Evaporation
  • Measurement
  • Reflection
  • Substrates
  • Transition Temperature
  • Wave Phenomena
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene