REFRACTORY MATERIALS RESEARCH
Abstract
In continuation of work begun earlier, vapor pressure studies of hafnium and tantalum nitride were completed using Knudsen effusion method combined with a gas collection and measuring system. The vaporization of ZrB2 has been studied, also by a Knudsen effusion method, modified in this application to obtain the effusion rate by continuous weighing of condensed effusate. Matrix isolation studies of the vapor from ZrO2 and HfO2 have been made as have additional measurements with ThO2 which was a subject of an earlier investigation. Resonance line absorption photometry has been applied to ZrB2. The results obtained are presented and discussed. Normal spectral emissivity data on single crystal tungsten, pyrolytic graphite and tantalum nitride have been obtained and are reported herein.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1964
- Accession Number
- AD0606836
Entities
People
- G. M. Kibler
- M. J. Linevsky
- T. F. Lyon
- V. J. Desantis
Organizations
- General Electric