PRODUCTION ENGINEERING MEASURE. PRODUCTION OF A SILICON PLANAR EPITAXIAL TRANSISTOR WITH A MAXIMUM OPERATING FAILURE RATE OF 0.001% PER 1000 HOURS AT A CONFIDENCE LEVEL OF 90% AT 25C.

Abstract

This report contains a summary of the results of the efforts expended in the Reliability Engineering area. Also contained are summaries of process change evaluation experiments, acceleration factor experiments and large scale testing. Comparisons are made of parameter distribution and stability, failure rate and mechanical ruggedness between the several processes developed during this Production Engineering Measure Program. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 30, 1963
Accession Number
AD0607294

Entities

People

  • L. E. Dwork
  • W. J. Corrigan

Organizations

  • Motorola Mobility

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Engineering
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Reliability
  • Reliability Engineering
  • Test And Evaluation
  • Transistors

Fields of Study

  • Engineering

Readers

  • Life Cycle Cost Analysis
  • Regression Analysis.
  • Semiconductor Device Technology