SECONDARY BREAKDOWN, RADIATION RESISTANCE AND FREQUENCY RESPONSE OF SILICON TRANSISTORS,
Abstract
This report points out the considerations that have to be taken into account when choosing a transistor which has good neutron radiation resistance and, in addition, secondary breakdown performance. There appears to be a point where optimum performance is obtained considering both requirements. However, the representation indicated can only be considered a static case since secondary breakdown is itself dependent on the amount of neutron exposure the device receives. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1964
- Accession Number
- AD0607561
Entities
People
- Bernard Reich
- Edward B. Hakim
Organizations
- United States Army Communications-Electronics Command