RELIABILITY MEASUREMENT FOR LONG LIFE SYSTEMS,
Abstract
It is shown that the exponential distribution has severe limitations for predicting long life. The Weibull Distribution with beta = 1/2 is shown to give more realistic results. Not only, are the estimates closer to the actual values, but the latter model is less sensitive to deviations in the actual distribution from the mathematical model. Predicting reliability of a long life system from limited test results gives rise to a special class of problems. To a large extent, these problems can be alleviated by using the Weibull (beta = 1/2) distribution coupled with a correction for limited testing. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 28, 1961
- Accession Number
- AD0607652
Entities
People
- E. L. Fritz
Organizations
- General Electric