A POROUS SUBSTRATE RESISTOR AIMED AT MINIATURIZATION OF METAL-FILM RESISTORS.

Abstract

A comparison of alumina with quartz porous substrates with respect to heat dissipation was inconclusive. The absence of intercommunicating porosity in the central portion of the alumina substrates prevented proper metallization. Temperature gradient data have been found to be very useful in appraising the quality of the terminals nondestructively. A resistance shift (hysteresis) is evident upon electrical loading. The magnitude of the shift is beyond what can be explained by temperature and/or voltage coefficients. Resistance hysteresis is still marked in resistors made from substrates with the most uniform structural properties. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 31, 1964
Accession Number
AD0607989

Entities

People

  • R. E. Busch
  • T. Matley

Tags

DTIC Thesaurus Topics

  • Film Resistors
  • Hysteresis
  • Metal Films
  • Resistance
  • Resistors
  • Structural Properties
  • Substrates
  • Temperature Gradients

Readers

  • Structural Health Monitoring of Composite Structures.
  • Systems Analysis and Design
  • Thin Film Deposition Science.