PHOTOELECTRIC PHENOMENA IN TUNNEL DIODE STRUCTURES.
Abstract
The purpose of this investigation is to examine the possibility of obtaining data concerning the potential barrier at a metal-dielectric interface by the measurement of the photo-response of the interface. A phenomenological description of the barrier is described and a simple theory is developed as a tool for the analysis. The experimental approach to the problem is given and preliminary photoelectric data is presented and discussed. The current vs voltage characteristics of the thin film dielectrics are used as a control on sample characteristics. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 12, 1964
- Accession Number
- AD0608228
Entities
People
- E. J. Scheibner
- J. R. Stevenson
Organizations
- Georgia Tech