THE USE OF SOFT X-RAYS FOR MATERIALS ANALYSIS: THE L EMISSION SPECTRA OF THE FE GROUP TRANSITION METALS AND THEIR OXIDES.
Abstract
A new analytical technique for determining the oxidation state of crystalline or amorphous oxide films of the first series transition metals was developed. This technique makes use of the soft X-ray L emission spectra of these metals and their oxides. A detailed study was made of the wavelengths, intensities and band shapes and the changes which occur in them when going from pure metal to various states of oxidation. The dependence of the L-II/L-III intensity ratio an excitation potential, valence state and atomic number is also presented as are the optimum peak to background conditions. Results were obtained using a flat crystal vacuum spectrometer with electron excitation and an ultra-thin window flow proportional counter. Crystals used were gypsum, mica, potassium acid phthalate (KAP) and rubidium acid phthalate (RbAP) with AlK alpha sub 1, 2 and AlK alpha sub 3, alpha sub 4 satellite doublet from Al2O3 as wavelength standard. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1964
- Accession Number
- AD0608258
Entities
People
- David W. Fischer
Organizations
- Air Force Research Laboratory