HIGH POWER SEMICONDUCTOR PHASE SHIFTING DEVICES, RELIABILITY TEST REPORT.

Abstract

The use of high power semiconductor devices for phase shifting in array antennas is being considered. The large number of these components in an operational system makes reliability data important. Progress made within the last study interval is reported. This includes the continuation of the life tests through the two thousand hour readings. Data reduction shows that the leakage current has a decreasing failure rate with time; early leakage failures should be screened out by a properly designed burn-in; alternate forward and reverse bias is a more severe test than continuous reverse bias and capacitance variations decrease as frequency increases. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1964
Accession Number
AD0608322

Entities

People

  • William W. Slavinsky Jr.

Organizations

  • M/A-COM Technology Solutions

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Capacitance
  • Compound Semiconductors
  • Data Reduction
  • Electronics
  • Frequency
  • Intervals
  • Life Tests
  • Reliability
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics

Fields of Study

  • Engineering

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Integrated Circuit Design and Technology.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems