5000-HOUR LIFE TEST DATA.

Abstract

5000-HOUR LIFE TEST DATA IS PRESENTED FOR THE IMPROVED SILICON EPITAXIAL 2N914 transistor.

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1964
Accession Number
AD0608685

Tags

DTIC Thesaurus Topics

  • Active Electronic Components
  • Electronic Components
  • Electronic Equipment
  • Electronics
  • Life Expectancy (Service Life)
  • Life Tests
  • Reliability
  • Semiconductor Devices
  • Transistors

Fields of Study

  • Physics