THE RELIABILITY OF ELECTRONIC COMPONENTS FOR USE IN REMINGTON RAND UNIVAC GROUND-BASED COMPUTER SYSTEMS. VOLUME IIIB: SIMULATED-USE LIFE-TEST DATA (DIODES).

Abstract

Presentation of Type HD2193 diode data for the simulated-use load-life experiment was designed to provide summarized statistics that could be used in a variety of computations which might arise in the design, operation, and maintenance of a ground-based computer system.

Document Details

Document Type
Technical Report
Publication Date
Mar 31, 1958
Accession Number
AD0609279

Entities

People

  • A. E. Mace
  • J. E. Brennan
  • K. E. Hassler
  • L. H. Stember Jr.
  • Robert L. Smith

Organizations

  • Sperry Corporation

Tags

DTIC Thesaurus Topics

  • Computations
  • Computers
  • Data Science
  • Electronic Components
  • Ground Based
  • Information Science
  • Life Expectancy (Service Life)
  • Life Tests
  • Maintenance
  • Mathematics
  • Reliability
  • Statistics

Readers

  • Civilian Systems Systems Program Capability Development and Upgrade Support Activity Expense and Pay Management.
  • Computer Science.
  • Electronics Engineering

Technology Areas

  • Microelectronics